From afb54ecaec67d6521b5c20c1407eff7e4f8656df Mon Sep 17 00:00:00 2001
From: buczekp <buczekp>
Date: Wed, 15 Dec 2010 22:57:06 +0000
Subject: [PATCH] minor: check if double delay will solve problems in tests
SVN: 19183
---
.../application/sample/GenericSampleRegistrationTest.java | 2 +-
1 file changed, 1 insertion(+), 1 deletion(-)
diff --git a/openbis/sourceTest/java/ch/systemsx/cisd/openbis/plugin/generic/client/web/client/application/sample/GenericSampleRegistrationTest.java b/openbis/sourceTest/java/ch/systemsx/cisd/openbis/plugin/generic/client/web/client/application/sample/GenericSampleRegistrationTest.java
index 2ef3da8b49b..fe4b02d26f8 100644
--- a/openbis/sourceTest/java/ch/systemsx/cisd/openbis/plugin/generic/client/web/client/application/sample/GenericSampleRegistrationTest.java
+++ b/openbis/sourceTest/java/ch/systemsx/cisd/openbis/plugin/generic/client/web/client/application/sample/GenericSampleRegistrationTest.java
@@ -138,6 +138,6 @@ public class GenericSampleRegistrationTest extends AbstractGWTTestCase
sampleTypeCode));
remoteConsole.prepare(new CheckSampleTable().expectedRow(new SampleRow(SHARED_CL)
.identifier("CISD").withUserPropertyCell("DESCRIPTION", description)));
- launchTest();
+ launchTest(DEFAULT_TIMEOUT * 2);
}
}
--
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